MESO SWIR Metrology System
Interferometry applications
The MESO™ instrument is a metrology solution for easy at-wavelength testing of flat surfaces in any environments. Testing diameter is ranging from 1,5’’ to 6’ in SWIR.
MESO SWIR Metrology Solution
MESO SWIR metrology system is a one-stop solution to many challenges in optical metrology. Shop floor measurements ensure quality control testing and in situ process control of your flat optics right next to the manufacturing line. A unique instrument allows to measure at several different wavelengths with no chromatic abberations and to characterize the whole range of your optics with no loss of resolution.
MESO™ is packed with innovation:
+ LIFT-enhanced high wavefront sensing resolution
+ POP patented procedure for the testing of (thin) plane parallel optics
+ Spot Tracker™ proprietary technology provides absolute measurement of tilt and wavefront.
KEY FEATURES
+ Insensitive to vibrations
+ At-design wavelength testing
+ Insensitive to reflections from sample back surface
APPLICATIONS
MESO is the perfect testing tool for the control of:
| + Parallel Optics + Screens + Filters, dichroics + Mirrors + Beamsplitters + Windows + Substrates + Corner cubes + Crystals |
+ Rods, Disks + Glass wafers + Displays + Machined surfaces + Windshields + Prisms + Large lenses + Optical systems + Beam expanders |
KEY SPECS of MESO SWIR metrology system
| + Horizontal or vertical integration + Optical zoom from 1,5’’ (38,1mm) up to 6’’ (152mm) + Testing wavelength from 405 nm to 820 nm + 680 x 500 phase points resolution + 27us minimum acquisition time |
+ Touchscreen interface control + Scripted testing procedures guide the user through all the steps + Automated control of up to 4 embedded wavelengths + Automated control of test diameter + Complete automated test report + ISO10110 standard compliance + Multiformat data export |
WAVESURF supportive Software for MESO metrology system
Wavesurf allows operators and engineers in manufacturing environments to perform wavefront and surface characterization of flat optics and large lenses with just a few clicks. Scripted testing procedures guide users through all the steps. It makes control easy, automated and error-proof.
Description |
Specifications |
| Test Beam Diameter | Optical zoom from 1.5″ (38.1mm) up to 6″ (152 mm) |
| Optical Axis | 4.25″ (108 mm) |
| Dimensions | 63 x 30 x 45 cm |
| Calibrated Range | 1050 nm to 1700 nm |
| Phase Point Resolution | 160 x 128 |
| Wavelength | Custom 1050, 1300, 1550 nm |
| Interface | USB 3.0 |