HASO SWIR LIFT 160
1050-1700 nm High resolution Alignment Free Wavefront Sensor
HASO SWIR LIFT 160
1050-1700 nm High resolution Alignment Free Wavefront Sensor
A great choice for the most demanding SWIR optical metrology applications, the HASO SWIR LIFT 160 wavefront sensor provides the highest resolution in SWIR,160 x 128 phase points resolution, 1050-1700 nm and it is Alignment free.
Compatible with the Optical Engineering Companion.
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HASO SWIR LIFT 160 Wavefront Sensor
A great choice for the most demanding SWIR optical metrology applications, the HASO SWIR LIFT 160 wavefront sensor provides the highest resolution in SWIR, and advanced features such SpotTracker for alignment. It also instantly combines with any other compatible instrument and accessory in the Optical Engineer Companion range. The advantages of wavefront sensing-based metrology in the Short – wave infrared first stem from Shack-Hartmann’s reliability and accuracy as well as its 25-year track record with the most popular, creative and demanding clients, including space agencies, semiconductor businesses, laser manufacturers , free-space communications companies, and AR/VR designers and manufacturers.
Applications for HASO SWIR LIFT 160 Wavefront Sensor
+ Optical manufacturing metrology
+ Complex optics Characterization
+ Middle frequencies mirror surface characterization
+ Optical quality control, metrology (LIDAR, free space communication, Automotive, Space and defense)
+ Prediction of an optical system performance in terms of focalization capability or imaging quality
+ Pilot a wavefront corrector to control system’s aberrations
+ Quantification of the effects of temperature and gravity on the performance of an optical system
FEATURES
Successfully used in the most demanding applications in optical metrology, laser diagnostics and adaptive optics, the HASO SWIR LIFT 160 performs multiple functions :
+ Direct wavefront acquisition of highly converging and diverging beams with an accuracy of λ/100 rms, including astigmatism and high-order aberration, and many other parameters, making for the perfect instrument for any complex optics alignment.
+ Beam collimation with sensitivity > 1 km radius of curvature
+ Control and adjustment of axial laser beam deviation > 3μrad rms
+ Complex optics characterization in single or double path configuration in combination with R-FLEX2 metrology systems or RFLEX LA metrology platforms.
+ 3D MTF measurements
+ Simultaneous and independent measurements of phase and intensity (patented)
