Applications - Comparing results from Zemax™ to the SL-Sys™ neo
  In this comparison, we show how the SL-Sys neo provides similar results to those obtained using Zemax. Why is that important? If these results were not similar, you would want to know the reason. Only the SL-Sys neo can provide you with the information to discover why!

The comparison was performed with a multi-element doublet from Melles Griot. The following points were compared:

  • Optical quality
  • Field curvature
  • Distortion
  • MTF

Optical quality:

In the image below, the screen capture on the left shows the optical quality as measured by the SL-Sys neo. The screen capture to the right shows the Zemax Simulation. The images to the far left, from top to bottom, show the Zemax WFE at 0°, 2.5°, 5°, 7.5° and 10°.


To quantify the comparison, a resume of the results is provided below:

Field ° SLSys neo - WFE rms (nm) Zemax WFE - rms (λ) Zemax WFE - rms (nm) Difference SLSys neo - Zemax (nm x10)
0 79 97 62 174
2.5 119 178 113 60
5 511 815 518 -65
7.5 1183 1894 1203 -197
10 2156 3399 2158 -24

The graph below shows how we observe excellent coherence between simulation and actual measurements, as the maximum variations (on the total range of over 2100 nm) is less than 20 nm.


Field curvature and distortion:

Two other optical parameters we can compare from simulation to the actual component are field curvature and distortion. Below, the screen capture to the right is the SL-Sys neo's representation of these measurements. To the left, the Zemax result.


Angle ° SLSys neo - Field curvature Zemax - Field curvature Difference SLSys neo
0 79 62 174
2.5 119 113 60
5 511 518 -65
7.5 1183 1203 -197
10 2156 2158 -24

From this data, we can draft the following curve:


The maximum difference between SL-Sys neo measurements and the Zemax simulation is 12 µm at the maximum field for a field curvature value 690µm; i.e. less than 2% of variation. Concerning the distortion, it is clear that the values obtained from the SL-Sys neo are coherent, even with measurements over a wide field curvature and with significant optical aberrations. Both give distortion below 1% over the entire field.


As the other comparions have shown, the optical parameters of the MTF are very similar between simulations and measurements (below)... with the same frequency limit and the same behavior for MTF for all the measured fields.


To see a video demonstration of the SL-Sys neo, click here.

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