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Applications - How does the SL-Sys™ neo function
 
  Many customers ask "how can one system do all that?" Below are some responses to the frequently asked questions about the SL-Sys neo and its patented technology.

How can the SL-Sys neo accurately characterize convergant optical components with no limits to numerical aperture?

neo_fig_1   Using a diffuser in the focal plane of the component being analyzed creates a punctual secondary reference source with an unlimited numerical aperture. Because the diffuser, situated at the device's focal point, is mounted on a z-axis translation stage, the beam is inherently collimated when it passes though the component being measured and thereby measured by the wavefront sensor which sends the data for analysis.

How can the SL-Sys neo measure the Effective Focal Length (EFL)?

As the illustration below shows, by displacing the diffuser along the z-axis, so that Δz becomes a known constant, the radius of curvature measured by the system delivers the value ΔR. The linear relationship between zΔ and RΔ directly provides the EFL.   neo_fig_2

How can the SL-Sys neo measure the entire field of view?

neo_fig_3   The SL-Sys neo's entire optical assembly is mounted on a y-axis rotation stage whereas the optical system itself is mounted on a second, independent z-axis rotation stage. This "double rotation" combination, whose parameters are completely controlled by the user, enables the SL-Sys neo to measure the entire field up to +/-45° of the optical axis.

Why do the Modulation Transfer Function (MTF) measurements provided by the SL-Sys neo enable a better analysis of the data than traditional MTF systems?

Traditional MTF systems are to the measurements obtained via one, two in some systems, slit and therefore only provide information on one (or two) axis. The SL-Sys neo uses a wavefront sensor to measure the MTF in 3-dimensions thanks to its HASO wavefront sensors' ability to measure phase and intensity profiles simultaneously and independently. Thanks to the functionality of the HASO wavefront sensor's at the heart of the SL-Sys neo, the MTF can be measured on any axis. This provides you with information that would otherwise be unobtainable with classic MTF systems. A simple example is the case of astigmatism which, if analyzed by an MTF system, would give different measurements depending on the orientation of the axis.  
ill4   ill4b
This figure shows how the MTF @
300 cycles/mm=0.28
  This figure shows how the MTF @
300 cycles/mm=0.14

To see a video demonstration of the SL-Sys neo, click here.

If you would like more information on our products, please call +33 (0)1 64 86 15 60 or e-mail us by clicking here.

 
 
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